Media type: E-Article Title: Surface Passivation of Boron-Diffused Junctions by a Borosilicate Glass and In Situ Grown Silicon Dioxide Interface Layer Contributor: Mihailetchi, Valentin D.; Chu, Haifeng; Lossen, Jan; Kopecek, Radovan imprint: Institute of Electrical and Electronics Engineers (IEEE), 2018 Published in: IEEE Journal of Photovoltaics Language: Not determined DOI: 10.1109/jphotov.2018.2792422 ISSN: 2156-3381; 2156-3403 Origination: Footnote: