Media type: E-Article Title: Characterizing Point Contacting by Localized Dielectric Breakdown and Its Use in Silicon Solar Cell Applications Contributor: Ye, Qilin; Western, Ned J.; Romer, Udo; Bremner, Stephen P. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2020 Published in: IEEE Journal of Photovoltaics Language: Not determined DOI: 10.1109/jphotov.2019.2953394 ISSN: 2156-3381; 2156-3403 Keywords: Electrical and Electronic Engineering ; Condensed Matter Physics ; Electronic, Optical and Magnetic Materials Origination: Footnote: