Media type: E-Article Title: Erase and Retention Improvements in Charge Trap Flash Through Engineered Charge Storage Layer Contributor: Goel, N.; Gilmer, D.C.; Park, H.; Diaz, V.; Sun, Y.; Price, J.; Park, C.; Pianetta, P.; Kirsch, P.D.; Jammy, R. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Electron Device Letters Language: Not determined DOI: 10.1109/led.2009.2012397 ISSN: 0741-3106; 1558-0563 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: