Media type: E-Article Title: Very Fast Dynamics of Threshold Voltage Drifts in GaN-Based MIS-HEMTs Contributor: Lagger, Peter; Schiffmann, Alexander; Pobegen, Gregor; Pogany, Dionyz; Ostermaier, Clemens imprint: Institute of Electrical and Electronics Engineers (IEEE), 2013 Published in: IEEE Electron Device Letters Language: Not determined DOI: 10.1109/led.2013.2272095 ISSN: 0741-3106; 1558-0563 Origination: Footnote: