Media type: E-Article Title: Multiport VNA measurement Contributor: Ruttan, Thomas; Grossman, Brett; Ferrero, Andrea; Teppati, Valeria; Martens, Jon imprint: Institute of Electrical and Electronics Engineers (IEEE), 2008 Published in: IEEE Microwave Magazine Language: Not determined DOI: 10.1109/mmm.2008.919919 ISSN: 1527-3342 Keywords: Electrical and Electronic Engineering ; Condensed Matter Physics ; Radiation Origination: Footnote: