• Media type: E-Article
  • Title: Review Article: Quantum-based vacuum metrology at the National Institute of Standards and Technology
  • Contributor: Scherschligt, Julia; Fedchak, James A.; Ahmed, Zeeshan; Barker, Daniel S.; Douglass, Kevin; Eckel, Stephen; Hanson, Edward; Hendricks, Jay; Klimov, Nikolai; Purdy, Thomas; Ricker, Jacob; Singh, Robinjeet; Stone, Jack
  • imprint: American Vacuum Society, 2018
  • Published in: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
  • Language: English
  • DOI: 10.1116/1.5033568
  • ISSN: 0734-2101; 1520-8559
  • Keywords: Surfaces, Coatings and Films ; Surfaces and Interfaces ; Condensed Matter Physics
  • Origination:
  • Footnote:
  • Description: <jats:p>The measurement science in realizing and disseminating the unit for pressure in the International System of Units, the pascal (Pa), has been the subject of much interest at the National Institute of Standards and Technology (NIST). Modern optical-based techniques for pascal metrology have been investigated, including multiphoton ionization and cavity ringdown spectroscopy. Work is ongoing to recast the pascal in terms of quantum properties and fundamental constants and in doing so make vacuum metrology consistent with the global trend toward quantum-based metrology. NIST has ongoing projects that interrogate the index of refraction of a gas using an optical cavity for low vacuum, and count background particles in high vacuum to extreme high vacuum using trapped laser-cooled atoms.</jats:p>