Media type: Electronic Conference Proceeding Title: Radiation-induced dark current increase in CMOS active pixel sensors Contributor: Bogaert, Jan; Dierickx, Bart; Van Hoof, Chris A. Published: SPIE, 2000 Published in: SPIE Proceedings (2000) Extent: Language: Not determined DOI: 10.1117/12.405333 ISSN: 0277-786X Origination: Footnote: