Media type: Electronic Conference Proceeding Title: Focused ion beam sectioning of miro-optics as a tool for destructive testing for optical material Contributor: Kane, D. M.; Chater, R. J.; McPhail, D. S. Published: SPIE, 2012 Published in: Micro-Optics 2012 (2012) Extent: Language: Not determined DOI: 10.1117/12.922154 ISSN: 0277-786X Origination: Footnote: