Media type: Electronic Conference Proceeding Title: Diffraction condition dependence of reflection high-energy electron diffraction (RHEED) dampening during molecular-beam epitaxy (MBE)growth Contributor: Block, Tom R.; Eiynk, Kurt G.; Neikirk, Dean P.; Streetman, Ben G. Published: SPIE, 1994 Published in: SPIE Proceedings (1994) Extent: Language: Not determined DOI: 10.1117/12.175791 ISSN: 0277-786X Origination: Footnote: