Media type: Electronic Conference Proceeding Title: Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials Contributor: Babentsov, Vladimir N.; Vlasenko, Aleksandr I.; Tarbaev, N. I. Published: SPIE, 1994 Published in: SPIE Proceedings, 2113 (1994), Seite 104-110 Extent: 104-110 Language: Without Specification DOI: 10.1117/12.191975 ISSN: 0277-786X Origination: Footnote: