Media type: Electronic Conference Proceeding Title: In-situ measurements of nanoscale phenomena using diffraction phase microscopy Contributor: Edwards, Chris; McKeown, Steven J.; Hwang, Suk-Won; Froeter, Paul J.; Li, Xiuling; Rogers, John A.; Popescu, Gabriel; Goddard, Lynford L. imprint: SPIE, 2015 Published in: SPIE Proceedings Extent: Language: Not determined DOI: 10.1117/12.2080253 ISSN: 0277-786X Origination: Footnote: