Media type: Electronic Conference Proceeding Title: MeV-level electron and gamma ray sensitivites of modern far ultraviolet sensitive microchannel plate detectors Contributor: Davis, Michael W.; Greathouse, Thomas K.; Cooke, Chathan M.; Blase, Ryan C.; Gladstone, G. Randall; Retherford, Kurt D. imprint: SPIE, 2016 Published in: SPIE Proceedings Extent: Language: Not determined DOI: 10.1117/12.2232755 ISSN: 0277-786X Origination: Footnote: