Media type: Electronic Conference Proceeding Title: 2D wavelet transform with different adaptive wavelet bases for texture defect inspection based on genetic algorithm Contributor: Liu, Hong; Mo, Yu L. Published: SPIE, 1998 Published in: SPIE Proceedings (1998) Extent: Language: Not determined DOI: 10.1117/12.319751 ISSN: 0277-786X Origination: Footnote: