One Size Fits All, After Tailoring The Patent Crisis and How the Courts Can Solve It by Dan L. Burk and Mark A. Lemley University of Chicago Press, Chicago, 2009. 228 pp. $45, £31. ISBN 9780226080611
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Media type:
E-Article
Title:
One Size Fits All, After Tailoring The Patent Crisis and How the Courts Can Solve It by Dan L. Burk and Mark A. Lemley University of Chicago Press, Chicago, 2009. 228 pp. $45, £31. ISBN 9780226080611
Contributor:
Eisenberg, Rebecca S.
Published:
American Association for the Advancement of Science (AAAS), 2009
Published in:
Science, 325 (2009) 5948, Seite 1625-1625
Description:
Claiming that serious problems arise from current U.S. patent law applying the same set of rules across all industries, Burk and Lemley argue for giving the courts the power to interpret and apply the law so as to treat different types of businesses differently.