Precise determination of polarization fields in c-plane GaN/Al x Ga1-x N/GaN heterostructures with capacitance–voltage-measurements

Media type: E-Article
Title: Precise determination of polarization fields in c-plane GaN/Al x Ga1-x N/GaN heterostructures with capacitance–voltage-measurements
Contributor: Susilo, Norman; Schilling, Marcel; Narodovitch, Michael; Yao, Hsin-Hung; Li, Xiaohang; Witzigmann, Bernd; Enslin, Johannes; Guttmann, Martin; Roumeliotis, Georgios G.; Rychetsky, Monir; Koslow, Ingrid; Wernicke, Tim; Niermann, Tore; Lehmann, Michael; Kneissl, Michael
imprint: IOP Publishing, 2019
Published in: Japanese Journal of Applied Physics
Language: Not determined
DOI: 10.7567/1347-4065/ab09dd
ISSN: 0021-4922; 1347-4065
Keywords: General Physics and Astronomy ; Physics and Astronomy (miscellaneous) ; General Engineering
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