IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 30. 2017 Cambridge,
Institute of Electrical and Electronics Engineers,
IEEE Computer Society,
IEEE Computer Society Test Technology Technical Council,
IEEE Computer Society Technical Committee on Fault Tolerant Computing
2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)