Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, and Thin Insulator Materials ; [presented at the Third Symposium on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, and Thin Insulator Materials held in Honolulu, Hawaii, May 19-21, 1993 ; this was a part of the 183rd Meeting of the Electrochemical Society ; the Symposium on "Reliability for Semiconductor Devices, Interconnects and Thin Insulator Materials" was held during the Spring Meeting of the Electrochemical Society, May 16 to 21, 1993 ...]