Schäfer, Michael
[Verfasser:in];
Bierwirth, Eike
[Verfasser:in];
Ehrlich, André
[Verfasser:in];
Heyner, Frank
[Verfasser:in];
Wendisch, Manfred
[Verfasser:in]
Retrieval of Cirrus Optical Thickness and Assessment of Crystal Shape from Ground-Based Imaging Spectrometry