Beschreibung:
Our work is focused on thermal analysis characterization of the Sn5Ge10Se85-xPbx (2.5≤x≤20 at. %) chalcogenide glasses using the differential thermal analysis (DTA) technique. The obtained DTA thermograms emphasized one endothermic peak, one exothermic peak, and one endothermic peak. The obtained data are analyzed using the methods of Lasocka and those based on the Johnson-Mehl-Avrami (JMA) model. Specifically, it has been used in the methods of Kissinger, Augis, and Bennett (AB), Matusita-Komatsu-Yokota (MKY), and Gao-Wang (GW). Most deduced values of the activation energy of crystallization extracted from the used analytical methods are nearly equal. The crystalline phases of the annealed glasses were detected using the X-ray diffraction (XRD) technique. Applying the GW method, it can be emphasized that, the concerned glasses are crystallized in two-dimension by surface crystallization