> Verlagsreihe
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Lifetime data: statistical models and methods Jayant V. Deshpande & Sudha G. Purohit (University of Pune, India)
New Jersey; London; Singapore; Beijing; Shanghai; Hong Kong; Taipei; Chennai; Tokyo: World Scientific, [2016]
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Basics of reliability and risk analysis worked out problems and solutions Enrico Zio; Piero Baraldi; Francesco Cadini
New Jersey; London [u.a.]: World Scientific, 2011