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Medientyp:
Buch
Titel:
Atomic force microscopy
:
understanding basic modes and advanced applications
Enthält:
Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation.