IEEE VLSI Test Symposium (1991 :Atlantic City, N.J.),
IEEE Computer Society Test Technology Technical Committee,
Institution of Electrical and Electronics Incorporated Engineers Philadelphia Section
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Medientyp:
E-Book;
Konferenzbericht
Titel:
Digest of papers
:
1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA
Weitere Titel:
Electronic reproduction has title: VLSI Test Symposium, 1991, "Chip-to-system test concerns for the 90's", digest of papers