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Kruse, Christian N. [VerfasserIn]; Wolf, Martin [VerfasserIn]; Schinke, Carsten [VerfasserIn]; Hinken, David [VerfasserIn]; Brendel, Rolf [VerfasserIn]; Bothe, Karsten [VerfasserIn]

Impact of contacting geometries on measured fill factors - [published Version]

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  • Medientyp: E-Artikel; Sonstige Veröffentlichung
  • Titel: Impact of contacting geometries on measured fill factors
  • Beteiligte: Kruse, Christian N. [VerfasserIn]; Wolf, Martin [VerfasserIn]; Schinke, Carsten [VerfasserIn]; Hinken, David [VerfasserIn]; Brendel, Rolf [VerfasserIn]; Bothe, Karsten [VerfasserIn]
  • Erschienen: London : Elsevier Ltd., 2017
  • Erschienen in: Energy Procedia 124 (2017)
  • Ausgabe: published Version
  • Sprache: Englisch
  • DOI: https://doi.org/10.15488/2273; https://doi.org/10.1016/j.egypro.2017.09.329
  • ISSN: 1876-6102
  • Schlagwörter: Solar cells ; Geometry ; Probe position ; Probes ; Different geometry ; IV characteristics ; Standard testing ; Fill Factor ; Tandem configuration ; Measured currents ; Busbars ; Current voltage characteristics ; Characterization of PV ; Sensitivity analysis ; Resistance variations ; Current-voltage characteristics
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  • Anmerkungen: Diese Datenquelle enthält auch Bestandsnachweise, die nicht zu einem Volltext führen.
  • Beschreibung: The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible.
  • Zugangsstatus: Freier Zugang
  • Rechte-/Nutzungshinweise: Namensnennung - Nicht-kommerziell - Keine Bearbeitung (CC BY-NC-ND)