• Medientyp: Sonstige Veröffentlichung; Bericht; E-Book
  • Titel: A shape calculus analysis for tracking type formulations in electrical impedance tomography
  • Beteiligte: Eppler, Karsten [Verfasser:in]
  • Erschienen: Weierstrass Institute for Applied Analysis and Stochastics publication server, 2006
  • Sprache: Englisch
  • DOI: https://doi.org/10.20347/WIAS.PREPRINT.1116
  • Schlagwörter: 49Q10 ; 65N38 ; 65K10 ; electrical impedance tomography -- shape calculus -- boundary integral equations -- ill-posed problems -- two norm discrepancy ; 65T60 ; 49M15 ; article ; 49K20
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  • Beschreibung: In the paper [17], the authors investigated the identification of an obstacle or void of perfectly conducting material in a two-dimensional domain by measurements of voltage and currents at the boundary. In particular, the reformulation of the given nonlinear identification problem was considered as a shape optimization problem using the Kohn and Vogelius criterion. The compactness of the complete shape Hessian at the optimal inclusion was proven, verifying strictly the ill-posedness of the identification problem. The aim of the paper is to present a similar analysis for the related least square tracking formulations. It turns out that the two-norm-discrepancy is of the same principal nature as for the Kohn and Vogelius objective. As a byproduct, the necessary first order optimality condition are shown to be satisfied if and only if the data are perfectly matching. Finally, we comment on possible consequences of the two-norm-discrepancy for the regularization issue.