Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Medientyp: E-Artikel
Titel: Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
Beteiligte: Schaab, J. [VerfasserIn]; Krug, I. P. [VerfasserIn]; Ramesh, R. [VerfasserIn]; Meier, D. [VerfasserIn]; Nickel, F. [VerfasserIn]; Gottlob, D. M. [VerfasserIn]; Doğanay, H. [VerfasserIn]; Cano, A. [VerfasserIn]; Hentschel, M. [VerfasserIn]; Yan, Z. [VerfasserIn]; Bourret, E. [VerfasserIn]; Schneider, C. M. [VerfasserIn]
Erschienen: American Institute of Physics, 2014
Erschienen in: Applied physics letters 104(23), 232904 - (2014). doi:10.1063/1.4879260
Sprache: Englisch
DOI: https://doi.org/10.1063/1.4879260
ISSN: 1077-3118; 0003-6951
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Beschreibung: High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established methodfor imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEMand demonstrate its capability for imaging and investigating domain walls in ferroelectrics withhigh spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls canbe visualized based on photo-induced charging effects and local variations in their electronicconductance can be mapped by analyzing the energy distribution of photoelectrons. Our resultsopen the door for non-destructive, contact-free, and element-specific studies of the electronicand chemical structure at domain walls in ferroelectrics.
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