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Schroer, C.G. [Verfasser:in]; Boyer, P. [Verfasser:in]; Lengeler, B. [Verfasser:in]; Falkenberg, G. [Verfasser:in]; Wellenreuther, G. [Verfasser:in]; Kuhlmann, M. [Verfasser:in]; Frahm, R. [Verfasser:in]; Lützenkirchen-Hecht, D. [Verfasser:in]; Schröder, W. H. [Verfasser:in]; Feldkamp, J. [Verfasser:in]; Patommel, J. [Verfasser:in]; Schropp, A. [Verfasser:in]; Samberg, D. [Verfasser:in]; Stephan, S. [Verfasser:in]; Burghammer, M. [Verfasser:in]; Schröder, S. [Verfasser:in]; Riekel, C. [Verfasser:in]

Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast

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  • Medientyp: E-Artikel
  • Titel: Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
  • Beteiligte: Schroer, C.G. [Verfasser:in]; Boyer, P. [Verfasser:in]; Lengeler, B. [Verfasser:in]; Falkenberg, G. [Verfasser:in]; Wellenreuther, G. [Verfasser:in]; Kuhlmann, M. [Verfasser:in]; Frahm, R. [Verfasser:in]; Lützenkirchen-Hecht, D. [Verfasser:in]; Schröder, W. H. [Verfasser:in]; Feldkamp, J. [Verfasser:in]; Patommel, J. [Verfasser:in]; Schropp, A. [Verfasser:in]; Samberg, D. [Verfasser:in]; Stephan, S. [Verfasser:in]; Burghammer, M. [Verfasser:in]; Schröder, S. [Verfasser:in]; Riekel, C. [Verfasser:in]
  • Erschienen: Acad. Inst., 2010
  • Erschienen in: Acta physica Polonica / A 117, 357 - 368 (2010). ; ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357
  • Sprache: Englisch
  • ISSN: 1898-794X; 0587-4246
  • Entstehung:
  • Anmerkungen: Diese Datenquelle enthält auch Bestandsnachweise, die nicht zu einem Volltext führen.
  • Beschreibung: We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
  • Zugangsstatus: Freier Zugang