Sub‐micrometer focusing setup for high‐pressure crystallography at the Extreme Conditions beamline at PETRA III

Medientyp: E-Artikel

Titel: Sub‐micrometer focusing setup for high‐pressure crystallography at the Extreme Conditions beamline at PETRA III

Beteiligte: Glazyrin, K. [VerfasserIn]; Khandarkhaeva, S. [VerfasserIn]; Fedotenko, T. [VerfasserIn]; Dong, W. [VerfasserIn]; Laniel, D. [VerfasserIn]; Seiboth, F. [VerfasserIn]; Schropp, A. [VerfasserIn]; Garrevoet, J. [VerfasserIn]; Brückner, D. [VerfasserIn]; Falkenberg, G. [VerfasserIn]; Kubec, A. [VerfasserIn]; David, C. [VerfasserIn]; Wendt, M. [VerfasserIn]; Wenz, S. [VerfasserIn]; Dubrovinsky, L. [VerfasserIn]; Dubrovinskaia, N. [VerfasserIn]; Liermann, H.-P. [VerfasserIn]; 2University of BayreuthBayerisches GeoinstitutUniversitätsstrasse 30 Bayreuth 95440 Germany [VerfasserIn]; 1Deutsches Elektronen-Synchrotron DESYNotkestrasse 85 Hamburg 22607 Germany [VerfasserIn]; 3University of BayreuthMaterial Physics and Technology at Extreme Conditions, Laboratory of CrystallographyUniversitätsstrasse 30 Bayreuth 95440 Germany [VerfasserIn]; 4Deutsches Elektronen-Synchrotron DESYCenter for X-ray and Nano Science CXNSNotkestrasse 85 Hamburg 22607 Germany [VerfasserIn]; 8Paul Scherrer InstitutLaboratory for Micro- and NanotechnologyForschungsstrasse 111 Villigen-PSI 5232 Switzerland [VerfasserIn]

Erschienen: International Union of Crystallography; 5 Abbey Square, Chester, Cheshire CH1 2HU, England, 2022-04-05

Sprache: Englisch

DOI: https://doi.org/10.1107/S1600577522002582

Schlagwörter: phase correcting plate ; sub‐micrometer focusing ; X‐ray diffraction ; high pressure ; diamond anvil cells

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Beschreibung: Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X‐ray diffraction instrumentation in terms of X‐ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRA III, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X‐ray beam to the sub‐micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal‐to‐noise ratio by conditioning the beam shape profile at the focal spot. A new sample alignment system with a small sphere of confusion enables single‐crystal data collection from grains of micrometer to sub‐micrometer dimensions subjected to pressures as high as 200 GPa. The combination of the technical development of the optical path and the sample alignment system contributes to research and gives benefits on various levels, including rapid and accurate diffraction mapping of samples with sub‐micrometer resolution at multimegabar pressures. ; Facing the challenges of X‐ray diffraction from tiny samples subjected to multimegabar pressures, instrumentation developments are presented that enable, among other studies, single‐crystal data collection from micrometer‐ to sub‐micrometer‐sized grains. The developments are based on a sub‐micrometer beam capability employing compound refractive lenses operating with a phase correcting plate and a precise motorization solution.

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