• Medientyp: E-Artikel
  • Titel: Thin films of aluminum nitride and aluminum gallium nitride for cold cathode applications
  • Beteiligte: Sowers, A. T.; Christman, J. A.; Bremser, M. D.; Ward, B. L.; Davis, R. F.; Nemanich, R. J.
  • Erschienen: AIP Publishing, 1997
  • Erschienen in: Applied Physics Letters
  • Sprache: Englisch
  • DOI: 10.1063/1.120052
  • ISSN: 0003-6951; 1077-3118
  • Schlagwörter: Physics and Astronomy (miscellaneous)
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  • Beschreibung: <jats:p>Cold cathode structures have been fabricated using AlN and graded AlGaN structures (deposited on n-type 6H-SiC) as the thin film emitting layer. The cathodes consist of an aluminum grid layer separated from the nitride layer by a SiO2 layer and etched to form arrays of either 1, 3, or 5 μm holes through which the emitting nitride surface is exposed. After fabrication, a hydrogen plasma exposure was employed to activate the cathodes. Cathode devices with 5 μm holes displayed emission for up to 30 min before failing. Maximum emission currents ranged from 10–100 nA and required grid voltages ranging from 20–110 V. The grid currents were typically 1 to 104 times the collector currents.</jats:p>