• Medientyp: E-Artikel
  • Titel: Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes
  • Beteiligte: Eckert, Rolf; Freyland, J. Moritz; Gersen, Henkjan; Heinzelmann, Harry; Schürmann, Gregor; Noell, Wilfried; Staufer, Urs; de Rooij, Nico F.
  • Erschienen: AIP Publishing, 2000
  • Erschienen in: Applied Physics Letters, 77 (2000) 23, Seite 3695-3697
  • Sprache: Englisch
  • DOI: 10.1063/1.1330571
  • ISSN: 1077-3118; 0003-6951
  • Schlagwörter: Physics and Astronomy (miscellaneous)
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  • Beschreibung: High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7±3.6 nm has been deduced from full width at half maximum values of single molecule images.