• Medientyp: E-Artikel
  • Titel: Copper-catalyzed etching of silicon by F2: Kinetics and feature morphology
  • Beteiligte: Selamoglu, Nur; Mucha, John A.; Flamm, Daniel L.; Ibbotson, Dale E.
  • Erschienen: AIP Publishing, 1988
  • Erschienen in: Journal of Applied Physics, 64 (1988) 3, Seite 1494-1498
  • Sprache: Englisch
  • DOI: 10.1063/1.341823
  • ISSN: 0021-8979; 1089-7550
  • Schlagwörter: General Physics and Astronomy
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  • Anmerkungen:
  • Beschreibung: The copper-catalyzed fluorination of silicon is first order in [F2] and in [Cu]s until the coverage reaches ∼4 monolayers. Above ∼4 monolayers the reaction rate is zero order in copper, suggesting a limited number of catalytically active Cu/Si sites. Copper islands form at high coverages, above saturation, and provide a reservoir of catalyst. The limited rate of surface diffusion of copper leads to anisotropic etching and feature size-dependent etch depths. The copper compounds, CuF2 and CuO, and copper silicides, Cu5Si and Cu3Si, all catalyzed the F2-Si reaction which suggests that they are all converted to the same active species. The results can be explained by mechanisms involving copper fluorides or copper silicides as active intermediates.