Beschreibung:
Significance We demonstrate an approach to generate a new type of X-ray imaging mode, which is called omnidirectional X-ray differential phase imaging. The proposed method enables us to detect the subtle phase changes in all directions of the imaging plane, which complements conventional X-ray imaging methods with information that they cannot provide. Importantly, the omnidirectional dark-field images can also be simultaneously retrieved for studying a wide range of complicated samples, particularly strongly ordered systems. The extracted information will not only provide insights into the microarchitecture of materials, but also enrich our understanding the macroscopic behavior. The presented technique could potentially open up numerous practical imaging applications in both biomedical research and materials science.