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Medientyp:
E-Artikel
Titel:
Studies on Reflectance-Temperature characteristics of AlGaN semiconductor at three communication windows
Beteiligte:
Mohanty, Sakti Prasan;
Mishra, C. S.;
Sahoo, S. K.;
Palai, G.
Erschienen:
IOP Publishing, 2020
Erschienen in:
IOP Conference Series: Materials Science and Engineering, 798 (2020) 1, Seite 012019
Sprache:
Nicht zu entscheiden
DOI:
10.1088/1757-899x/798/1/012019
ISSN:
1757-8981;
1757-899X
Entstehung:
Anmerkungen:
Beschreibung:
Abstract This paper reports the temperature variation of reflectance with respect to AlGaN wave guide structure. Plane wave expansion technique is employed for simulation to exhibit the reflectance pertaining to AlGaN wave guide structure. The simulation results show the approximate linear variation of reflectance with respect to temperature in the aforementioned AlGaN photonic wave guide structure at threecommunication windows (850 nm, 1310 nm, 1550 nm). Such characteristic study yields with accuracy, the realization of temperaturedependence of reflectance.