Beschreibung:
AbstractThe reliability of estimation of Debye temperature θD evaluated from bulk modul and microhardness is proved for semiconductors with diamond, sphalerite, and chalcopyrite structure. The known linear relations available from the literature do not yield a reasonable agreement between experimental and calculated Debye temperatures. As in the case of the Lindemann rule a better approximation is obtained by use of a more general relation θD = a1x + a2. The constants a1 and a2 are calculated for the substances under consideration. Unknown Debye temperatures are calculated.