Beschreibung:
AbstractThe exact characterization of natural crystal faces is very important from the point of view of the proper conditions of crystal growth and of the choice of an appropriate substrate for obtaining epitaxial layers. In this work various X‐ray diffraction methods were used to obtain the maximum information about the CdTe crystal surface structure. Applied X‐ray techniques allowed to detect the number of defects even on the natural mirror‐like faces of the crystal which can be treated as a seemingly perfect one.