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Téllez, Helena; Vadillo, José M.; Laserna, J. Javier

Energy‐resolved depth profiling of metal‐polymer interfaces using dynamic quadrupole secondary ion mass spectrometry

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  • Medientyp: E-Artikel
  • Titel: Energy‐resolved depth profiling of metal‐polymer interfaces using dynamic quadrupole secondary ion mass spectrometry
  • Beteiligte: Téllez, Helena; Vadillo, José M.; Laserna, J. Javier
  • Erschienen: Wiley, 2009
  • Erschienen in: Rapid Communications in Mass Spectrometry
  • Sprache: Englisch
  • DOI: 10.1002/rcm.4151
  • ISSN: 0951-4198; 1097-0231
  • Schlagwörter: Organic Chemistry ; Spectroscopy ; Analytical Chemistry
  • Entstehung:
  • Anmerkungen:
  • Beschreibung: <jats:title>Abstract</jats:title><jats:p>Quadrupole secondary ion mass spectrometry (qSIMS) characterization of a metallized polypropylene film used in the manufacturing of capacitors has been performed. Ar<jats:sup>+</jats:sup> primary ions were used to preserve the oxidation state of the surface. The sample exhibits an incomplete metallization that made it difficult to determine the exact location of the metal‐polymer interface due to the simultaneous contribution of ions with identical <jats:italic>m/z</jats:italic> values from the metallic and the polymer layers. Energy filtering by means of a 45° electrostatic analyzer allowed resolution of the metal‐polymer interface by selecting a suitable kinetic energy corresponding to the ions generated in the metallized layer but not from the polymer. Under these conditions, selective analyses of isobaric interferences such as <jats:sup>27</jats:sup>Al<jats:sup>+</jats:sup> and <jats:sup>27</jats:sup>C<jats:sub>2</jats:sub>H<jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="graphic/tex2gif-stack-1.gif" xlink:title="urn:x-wiley:09514198:media:RCM4151:tex2gif-stack-1" /> or <jats:sup>43</jats:sup>AlO<jats:sup>+</jats:sup> and <jats:sup>43</jats:sup>C<jats:sub>3</jats:sub>H<jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="graphic/tex2gif-stack-2.gif" xlink:title="urn:x-wiley:09514198:media:RCM4151:tex2gif-stack-2" /> have been successfully performed. Copyright © 2009 John Wiley &amp; Sons, Ltd.</jats:p>