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Téllez, Helena; Vadillo, José M.; Laserna, José J.

Secondary ion mass spectrometry of powdered explosive compounds for forensic evidence analysis

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  • Medientyp: E-Artikel
  • Titel: Secondary ion mass spectrometry of powdered explosive compounds for forensic evidence analysis
  • Beteiligte: Téllez, Helena; Vadillo, José M.; Laserna, José J.
  • Erschienen: Wiley, 2012
  • Erschienen in: Rapid Communications in Mass Spectrometry
  • Sprache: Englisch
  • DOI: 10.1002/rcm.6213
  • ISSN: 0951-4198; 1097-0231
  • Schlagwörter: Organic Chemistry ; Spectroscopy ; Analytical Chemistry
  • Entstehung:
  • Anmerkungen:
  • Beschreibung: <jats:sec><jats:title>RATIONALE</jats:title><jats:p>Residual quantities of explosives deposited on, or absorbed in, nearby surfaces can be of forensic value in post‐blast analysis. As secondary ion mass spectrometry (SIMS) may be a suitable analytical approach for the screening of such residues, its performance was evaluated.</jats:p></jats:sec><jats:sec><jats:title>METHODS</jats:title><jats:p>The analyses were carried out in a SIMS instrument fitted with a quadrupole analyzer. The sample was sputtered at a 45º incidence angle with a 100 µm primary Ar<jats:sup>+</jats:sup> beam (3 keV, 500 nA). Surface sample compensation was performed with low‐energy electrons (500 eV, 0.75 mA).</jats:p></jats:sec><jats:sec><jats:title>RESULTS</jats:title><jats:p>TNT, RDX, PETN and cloratite were deposited in powdered form on double‐sided tape and introduced into the mass spectrometer, without further handling, for SIMS analysis. The analysis conditions including compensation were optimized. A mixture of energetic compounds commonly used for explosive preparation was also analyzed, proving the potential of SIMS in forensic analysis.</jats:p></jats:sec><jats:sec><jats:title>CONCLUSIONS</jats:title><jats:p>This study demonstrated the possibility of detecting explosives by SIMS making use of a simple sampling procedure consisting of sticking the sample in powdered form (compatible with the collection performed in forensic post‐blast analysis) onto double‐sided tape without handling or preparation. Copyright © 2012 John Wiley &amp; Sons, Ltd.</jats:p></jats:sec>