• Medientyp: E-Artikel
  • Titel: In Situ Transmission Electron Microscopy Observation of Au–Si Interface Reaction
  • Beteiligte: Ishikawa, Yukari; Tomohiro Saito, Tomohiro Saito; Noriyoshi Shibata, Noriyoshi Shibata
  • Erschienen: IOP Publishing, 1996
  • Erschienen in: Japanese Journal of Applied Physics, 35 (1996) 6B, Seite L796
  • Sprache: Ohne Angabe
  • DOI: 10.1143/jjap.35.l796
  • ISSN: 1347-4065; 0021-4922
  • Schlagwörter: General Physics and Astronomy ; General Engineering
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  • Beschreibung: Cross-sectional transmission electron microscopy (TEM) was used to observe Au–Si reaction and Si pyramid formation processes in situ. The Au–Si reaction occurred in three stages in a heating process; Au and Si layers reacted through a rough Au/Si interface, the rough Au/Si interface suddenly became flat, and single-crystal Si suddenly changed into a microcrystalline Au–Si layer. Si pyramids were formed in the Au layer in a cooling process, although Au pyramids were formed in the Si substrate by annealing in air. It is concluded that Au- and Si-pyramid formation depends on the Au and Si concentrations in the reaction area, which vary with the degree of surface oxidation.