Beschreibung:
<jats:p>Nano-resolution synchrotron X-ray spectro-tomography has been demonstrated as a powerful tool for probing the three-dimensional (3D) structural and chemical heterogeneity of a sample. By reconstructing a number of tomographic data sets recorded at different X-ray energy levels, the energy-dependent intensity variation in every given voxel fingerprints the corresponding local chemistry. The resolution and accuracy of this method, however, could be jeopardized by non-ideal experimental conditions, <jats:italic>e.g.</jats:italic> instability in the hardware system and/or in the sample itself. Herein is presented one such case, in which unanticipated sample deformation severely degrades the data quality. To address this issue, an automatic 3D image registration method is implemented to evaluate and correct this effect. The method allows the redox heterogeneity in partially delithiated Li<jats:sub>
<jats:italic>x</jats:italic>
</jats:sub>Ta<jats:sub>0.3</jats:sub>Mn<jats:sub>0.4</jats:sub>O<jats:sub>2</jats:sub> battery cathode particles to be revealed with significantly improved fidelity.</jats:p>