Solving the Third-Shift Problem in IC Piracy With Test-Aware Logic Locking

Medientyp: E-Artikel
Titel: Solving the Third-Shift Problem in IC Piracy With Test-Aware Logic Locking
Beteiligte: Plaza, Stephen M.; Markov, Igor L.
Erschienen: Institute of Electrical and Electronics Engineers (IEEE), 2015
Erschienen in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sprache: Nicht zu entscheiden
DOI: 10.1109/tcad.2015.2404876
ISSN: 0278-0070; 1937-4151
Schlagwörter: Electrical and Electronic Engineering ; Computer Graphics and Computer-Aided Design ; Software
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