Design Rule Violation Prediction at Sub-10-nm Process Nodes Using Customized Convolutional Networks

Medientyp: E-Artikel
Titel: Design Rule Violation Prediction at Sub-10-nm Process Nodes Using Customized Convolutional Networks
Beteiligte: Liang, Rongjian; Xiang, Hua; Pandey, Diwesh; Reddy, Lakshmi N.; Ramji, Shyam; Nam, Gi-Joon; Hu, Jiang
Erschienen: Institute of Electrical and Electronics Engineers (IEEE), 2022
Erschienen in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sprache: Nicht zu entscheiden
DOI: 10.1109/tcad.2021.3126676
ISSN: 0278-0070; 1937-4151
Schlagwörter: Electrical and Electronic Engineering ; Computer Graphics and Computer-Aided Design ; Software
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