• Medientyp: E-Artikel
  • Titel: Scanning capacitance microscopy using a relaxation oscillator
  • Beteiligte: Pahlmeyer, M.; Hankins, A.; Tuppan, S.; Kim, W. J.
  • Erschienen: American Association of Physics Teachers (AAPT), 2015
  • Erschienen in: American Journal of Physics, 83 (2015) 2, Seite 104-109
  • Sprache: Englisch
  • DOI: 10.1119/1.4899045
  • ISSN: 0002-9505; 1943-2909
  • Schlagwörter: General Physics and Astronomy
  • Entstehung:
  • Anmerkungen:
  • Beschreibung: We have performed scanning capacitance microscopy using a relaxation oscillator. Precision calibrations indicate a sensitivity on the order of 0.05 pF. Surface topography of metallic structures, such as machined grooves and coins, can be readily obtained either in the constant-height (non-contact) or tapping (contact) mode. Spatial resolution of less than 50 μm has been achieved. Our simple, low-cost system can be a valuable platform in the undergraduate laboratory, providing students with experience in microscopic imaging techniques.