Beschreibung:
<jats:p>We propose a simplified and time-efficient methodology to characterize the permittivity of unknown materials. Based on the transmission line method, this method enables permittivity extraction using a small number of dielectric materials under test (MUT). It is fully compatible with conventional electromagnetic measurement environments and does not require any modification, since the extraction is conducted simply by replacing the MUT above the coplanar waveguide (CPW). The proposed approach enables a more concise and faster measurement process compared to conventional methods previously reported in the literature. This method is then numerically and experimentally verified through various MUTs that have different permittivities or thicknesses. The results are determined to be valid over a continuous frequency range of 1.0 GHz–30.0 GHz with an average accuracy of over 95.0%.</jats:p>