Beschreibung:
<jats:p>Industrial defect detection plays an important role in smart manufacturing and is widely used in various scenarios such as smart inspection and product quality control. Currently, although utilizing a framework for knowledge distillation to identify industrial defects has achieved great progress, it is still a significant challenge task to extract better image features and prevent overfitting for student networks. In this study, a reverse knowledge distillation framework with two teachers is designed. First, for the teacher network, two teachers with different architectures are used to extract the diverse features of the images from multiple models. Second, considering the different contributions of channels and different teacher networks, the attention mechanism and iterative attention feature fusion idea are introduced. Finally, to prevent overfitting, the student network is designed with a network architecture that is inconsistent with the teacher network. Extensive experiments were conducted on Mvtec and BTAD datasets, which are industrial defect detection datasets. On the Mvtec dataset, the average accuracy values of image-level and pixel-level ROC achieved 99.43% and 97.87%, respectively. On the BTAD dataset, the average accuracy values of image-level and pixel-level ROC reached 94% and 98%, respectively. The performance on both datasets is significantly improved, demonstrating the effectiveness of our method.</jats:p>