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Medientyp:
E-Artikel
Titel:
Advantages of External Reflection and Transflection over ATR in the Rapid Material Characterization of Negatives and Films via FTIR Spectroscopy
Beschreibung:
<jats:p>The identification of film support material is of utmost importance for evidence-based collection management in cultural heritage institutions, especially the identification of cellulose nitrate for fire safety reasons, as nitrate is highly flammable and deteriorates over time. Cellulose nitrate film was used by photographers and movie filmmakers from its release in the 1880s to the 1950s. Cellulose acetate, being called safety film, gradually began to replace cellulose nitrate, as it is not flammable. Despite its non-flammable properties, cellulose acetate also deteriorates in hazardous ways. Therefore, identification of cellulose nitrate and cellulose acetate in collections is imperative for preservation and risk management to collections and humans. Large photographic collections can easily contain several thousand negatives or more, so a rapid, non-invasive and reliable method is needed. Traditional identification methods, such as destructive chemical tests, are sometimes unreliable, and spectroscopic analyses are normally time-consuming. To overcome these issues, rapid material characterization was performed in transflection mode with a Fourier-transform infrared (FTIR) spectrometer equipped with an external reflectance module and an additional aluminum-foil reflector. With this newly developed method, the support material (cellulose nitrate, cellulose acetate and polyester) of about 99.8% of all films can be determined within two seconds of measuring time, without any further spectral processing. Very distinctive spectral patterns are obtained with this new method, regardless of which side of the film is being analyzed. A simple visual inspection of the raw spectrum is usually sufficient to determine the film support identity. A detailed comparison of the various FTIR techniques shows the advantages of the transflection measurement for the material characterization of film support layers. This newly developed method enables the non-invasive, rapid and unambiguous material identification of even large film collections in a short time.</jats:p>