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Dunsmore, Joel P. [Author]

Handbook of microwave component measurements : with advanced VNA techniques - [Second edition]

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Hoboken, NJ: Wiley, 2020
Sadorf, Helmut [Author]

Ein Elektronenstrahltestsystem zur Bestimmung des Potentialkontrastes im Innern integrierter Schaltungen mit Josephson-Kontakten

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1988
Zerbst, Manfred [Editor]; Cuno, Hans-Hellmuth [Other]

Meß- und Prüftechnik

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Berlin; Heidelberg [u.a.]: Springer, 1986

Published in: Halbleiter-Elektronik ; 2000
Meyendorf, Norbert [Other]; Meyendorf, Norbert G. H. [Editor] ; National Institute of Standards and Technology USA, SPIE, The International Society for Optical Engineering

Testing, reliability, and application of micro- and nano-material systems : 3 - 5 March 2003, San Diego, California, USA

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Bellingham, Wash.: SPIE, 2003

Published in: SPIE, The International Society for Optical Engineering: Proceedings ; 5045
Garrett, Patrick H. [Author]

Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems

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New York, NY: Wiley, c2002

Published in: A Wiley-Interscience publication
Sharma, Ashok K. [Author]

Semiconductor memories : technology, testing, and reliability

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Piscataway, NJ: IEEE Press, 1997
Bushnell, Michael L. [Author]; Agrawal, Vishwani D. [Author]

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

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Boston, Mass.; London [u.a.]: Kluwer Academic, 2000

Published in: Frontiers in electronic testing ; 17
Rastogi, Pramod K. [Editor]

Photomechanics

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Berlin; Heidelberg [u.a.]: Springer, 2000

Published in: Topics in applied physics ; 77
Zhao, Yang [Author] ; Chakrabarty, Krishnendu [Other]

Design and testing of digital microfluidic biochips

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New York; Heidelberg [u.a.]: Springer, 2013
Knott, Daniel [Author] ; Röttger, Nils [Translator] Dpunkt.Verlag Heidelberg

Mobile App Testing : Praxisleitfaden für Softwaretester und Entwickler mobiler Anwendungen - [1. Auflage]

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Heidelberg: dpunkt.verlag, 2016
Schroder, Dieter K. [Author]

Semiconductor material and device characterization - [2. ed.]

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New York; Weinheim [u.a.]: Wiley, 1998

Published in: A Wiley-Interscience publication
Schroder, Dieter K. [Author]

Semiconductor material and device characterization

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New York [u.a.]: Wiley, c1990

Published in: A Wiley-Interscience publication
Adachi, Masayuki [Editor]; Nakamura, Hiroshi [Other] ; HORIBA, Ltd

Engine emissions measurement handbook : HORIBA automotive test systems

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Warrendale, Pennsylvania: SAE International, c 2014

Published in: Automotive
Yang, Fuqian [Editor]; Li, James C. M. [Other]

Micro and nano mechanical testing of materials and devices

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New York, NY: Springer, 2008
Schroder, Dieter K. [Author]

Semiconductor material and device characterization - [Third edition]

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Hoboken, NJ: Wiley-Interscience, [2006]
Benton, Janet L. [Editor]; Maracas, George Nicolas [Editor]; Rai-Choudhury, P. [Editor] ; Symposium on Diagnostic Techniques for Semiconductor Materials and Devices 2 1991 Phoenix, Ariz, Electrochemical Society Electronics Division, Electrochemical Society Dielectric Science and Technology Division

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices : [... the compilation of the papers ...]

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Pennington, N.J.: Electrochemical Society, 1992

Published in: Electrochemical Society: Proceedings volume ; 92,2
Wiklund, Michael E. [Author]; Kendler, Jonathan [Author] ; Strochlic, Allison Y. [Other]

Usability testing of medical devices

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Boca Raton, Fl.a [u.a.]: CRC Press, 2011
Grasserbauer, Manfred [Editor]; Werner, H. W. [Other]

Analysis of microelectronic materials and devices

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Chichester [u.a.]: John Wiley & Sons, 1991
Fleetwood, Daniel M. [Author] ; Pantelides, Sokrates T. [Other]; Schrimpf, Ronald D. [Other]; Pantelides, Sokrates [Other]; Schrimpf, Ronald Donald [Other]

Defects in microelectronic materials and devices

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Boca Raton, Fla. [u.a.]: CRC Press, 2009
Braybrook, Julian H. [Editor]

Biocompatibility assessment of medical devices and materials

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Chichester [u.a.]: Wiley, 1997

Published in: Biomaterials science and engineering series

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