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Media type: Serial; Monograph Series
Title: Frontiers in electronic testing
Other titles: Nebent.: FRET
imprint: Boston, Mass. [u.a.]: Kluwer, 1995-
Berlin [u.a.]: Springer, 1995-
Publication information: Nachgewiesen 3.1995 -
Language: Not determined
Keywords: Monografische Reihe
Origination:
Footnote:

> Publishers' series

Nicolaidis, Michael [Editor]
41: Soft errors in modern electronic systems Michael Nicolaidis ed
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Tehranipoor, Mohammad [Editor]
37: Emerging nanotechnologies test, defect tolerance, and reliability Mohammad Tehranipoor ed
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Pavlov, A. P. [Author]; Sachdev, Manoj [Author]
40: CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Andrei Pavlov; Manoj Sachdev
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Gössel, Michael [Other]; Ocheretny, Vitaly [Other]; Sogomonyan, Egor [Other]; Marienfeld, Daniel [Other]
42: New methods of concurrent checking by Michael Goessel
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Sachdev, Manoj [Author]; Pineda de Gyvez, José [Author]
34: Defect-oriented testing for nano-metric CMOS VLSI circuits by Manoj Sachdev; José Pineda de Gyvez
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Kastensmidt, Fernanda Lima [Author]; Carro, Luigi [Author]; Reis, Ricardo [Author]
32: Fault tolerance techniques for SRAM based FPGAs by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Gizopoulos, Dimitris [Editor]
27: Advances in electronic testing challenges and methodologies ed. by Dimitris Gizopoulos
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Larsson, Erik [Author]
29: Introduction to advanced system on chip test design and optimization by Erik Larsson
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Kabisatpathy, Prithviraj [Author]; Barua, Alok [Author]; Sinha, Satyabroto [Author]
30: Fault diagnosis of analog integrated circuits Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Benso, Alfredo [Editor]; Prinetto, Paolo [Other]
23: Fault injection techniques and tools for embedded systems reliability evaluation ed. by Alfredo Benso
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Nicolici, Nicola [Author] ; Al-Hashimi, Bashir M. [Other]
22: Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Stroud, Charles E. [Author]
19: A designer's guide to built-in self-test Charles E. Stroud
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Sousa, José T. de [Author]; Cheung, Peter T. Y. [Author]
18: Boundary scan interconnect diagnosis José T. de Sousa and Peter Y. K. Cheung
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-

Bushnell, Michael L. [Author]; Agrawal, Vishwani D. [Author]
17: Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Michael L. Bushnell; Vishwani D. Agrawal
Boston, Mass. [u.a.]: Kluwer, 1995- ; Berlin [u.a.]: Springer, 1995-