Skip to contents Nanver, Lis K. [Author] High-performance BIFET process for analog integrated circuits Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 1987 Qi, Lin; Nanver, Lis K. Conductance Along the Interface Formed by 400 °C Pure Boron Deposition on Silicon Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2015 Published in: IEEE Electron Device Letters, 36 (2015) 2, Seite 102-104 Krakers, Max; Knežević, Tihomir; Nanver, Lis K. Optoelectrical Operation Stability of Broadband PureGaB Ge-on-Si Photodiodes with Anomalous Al-Mediated Sidewall Contacting Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2021 Published in: Journal of Electronic Materials, 50 (2021) 12, Seite 7026-7036 Sammak, Amir; Qi, Lin; Nanver, Lis K. Restricted-Access Al-Mediated Material Transport in Al Contacting of PureGaB Ge-on-Si p + n Diodes Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2015 Published in: Journal of Electronic Materials, 44 (2015) 12, Seite 4676-4683 Qi, Lin; Lorito, Gianpaolo; Nanver, Lis K. Lateral-Transistor Test Structures for Evaluating the Effectiveness of Surface Doping Techniques Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2012 Published in: IEEE Transactions on Semiconductor Manufacturing, 25 (2012) 4, Seite 581-588 Popadic, Milos; Lorito, Gianpaolo; Nanver, Lis K. Analytical Model of Characteristics of Arbitrarily Shallow p-n Junctions Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electron Devices, 56 (2009) 1, Seite 116-125 Civale, Yann; Nanver, Lis K.; Schellevis, Hugo Selective Solid-Phase Silicon Epitaxy of ${\hbox{p}}^{+}$ Aluminum-Doped Contacts for Nanoscale Devices Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2007 Published in: IEEE Transactions On Nanotechnology, 6 (2007) 2, Seite 196-200 Civale, Y.; Nanver, Lis K.; Schellevis, H. Material-Inversion Solid-Phase Epitaxy of p+ Si forElevated Junctions Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. The Electrochemical Society, 2006 Published in: ECS Meeting Abstracts, MA2006-02 (2006) 20, Seite 1006-1006 Knezevic, Tihomir; Suligoj, Tomislav; Capan, Ivana; Nanver, Lis K. Low-Temperature Electrical Performance of PureB Photodiodes Revealing Al-Metallization-Related Degradation of Dark Currents Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2021 Published in: IEEE Transactions on Electron Devices, 68 (2021) 6, Seite 2810-2817 Shivakumar, D. Thammaiah; Knežević, Tihomir; Nanver, Lis K. Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Si Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2021 Published in: Journal of Materials Science: Materials in Electronics, 32 (2021) 6, Seite 7123-7135 Osrečki, Željko; Knežević, Tihomir; Nanver, Lis K.; Suligoj, Tomislav Indirect optical crosstalk reduction by highly-doped backside layer in single-photon avalanche diode arrays Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2018 Published in: Optical and Quantum Electronics, 50 (2018) 3 Liu, Xingyu; Nanver, Lis K.; Scholtes, Tom L. M. Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2017 Published in: Journal of Microelectromechanical Systems, 26 (2017) 6, Seite 1428-1434 Sammak, Amir; Aminian, Mahdi; Nanver, Lis K.; Charbon, Edoardo CMOS-Compatible PureGaB Ge-on-Si APD Pixel Arrays Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2016 Published in: IEEE Transactions on Electron Devices, 63 (2016) 1, Seite 92-99 Shi, Lei; Nihtianov, Stoyan; Nanver, Lis K.; Scholze, Frank Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2013 Published in: IEEE Sensors Journal, 13 (2013) 5, Seite 1699-1707 Sarubbi, Francesco; Scholtes, Tom L. M.; Nanver, Lis K. Chemical Vapor Deposition of α-Boron Layers on Silicon for Controlled Nanometer-Deep p + n Junction Formation Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2010 Published in: Journal of Electronic Materials, 39 (2010) 2, Seite 162-173 Sarubbi, Francesco; Nanver, Lis K.; Scholtes, Tom L. M. High Effective Gummel Number of CVD Boron Layers in Ultrashallow $\hbox{p}^{+}\hbox{n}$ Diode Configurations Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2010 Published in: IEEE Transactions on Electron Devices, 57 (2010) 6, Seite 1269-1278 Rinaldi, NiccolÒ; d'Alessandro, Vincenzo; Nanver, Lis K. Analysis of the Bipolar Current Mirror Including Electrothermal and Avalanche Effects Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electron Devices, 56 (2009) 6, Seite 1309-1321 Sarubbi, Francesco; Nanver, Lis K.; Scholtes, Tom L. CVD Delta-Doped Boron Surface Layers for Ultra-Shallow Junction Formation Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. The Electrochemical Society, 2006 Published in: ECS Meeting Abstracts, MA2006-02 (2006) 20, Seite 1000-1000 Qi, Lin; Mok, K. R. C.; Aminian, Mahdi; Charbon, Edoardo; Nanver, Lis K. UV-Sensitive Low Dark-Count PureB Single-Photon Avalanche Diode Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2014 Published in: IEEE Transactions on Electron Devices, 61 (2014) 11, Seite 3768-3774 Nanver, Lis K.; Hassan, Vinayak V.; Attariabad, Asma; Rosson, Nicholas; Arena, Chantal J. Broadband PureB Ge-on-Si Photodiodes Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2024 Published in: IEEE Electron Device Letters, 45 (2024) 6, Seite 1040-1043
Nanver, Lis K. [Author] High-performance BIFET process for analog integrated circuits Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 1987
Qi, Lin; Nanver, Lis K. Conductance Along the Interface Formed by 400 °C Pure Boron Deposition on Silicon Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2015 Published in: IEEE Electron Device Letters, 36 (2015) 2, Seite 102-104
Krakers, Max; Knežević, Tihomir; Nanver, Lis K. Optoelectrical Operation Stability of Broadband PureGaB Ge-on-Si Photodiodes with Anomalous Al-Mediated Sidewall Contacting Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2021 Published in: Journal of Electronic Materials, 50 (2021) 12, Seite 7026-7036
Sammak, Amir; Qi, Lin; Nanver, Lis K. Restricted-Access Al-Mediated Material Transport in Al Contacting of PureGaB Ge-on-Si p + n Diodes Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2015 Published in: Journal of Electronic Materials, 44 (2015) 12, Seite 4676-4683
Qi, Lin; Lorito, Gianpaolo; Nanver, Lis K. Lateral-Transistor Test Structures for Evaluating the Effectiveness of Surface Doping Techniques Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2012 Published in: IEEE Transactions on Semiconductor Manufacturing, 25 (2012) 4, Seite 581-588
Popadic, Milos; Lorito, Gianpaolo; Nanver, Lis K. Analytical Model of Characteristics of Arbitrarily Shallow p-n Junctions Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electron Devices, 56 (2009) 1, Seite 116-125
Civale, Yann; Nanver, Lis K.; Schellevis, Hugo Selective Solid-Phase Silicon Epitaxy of ${\hbox{p}}^{+}$ Aluminum-Doped Contacts for Nanoscale Devices Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2007 Published in: IEEE Transactions On Nanotechnology, 6 (2007) 2, Seite 196-200
Civale, Y.; Nanver, Lis K.; Schellevis, H. Material-Inversion Solid-Phase Epitaxy of p+ Si forElevated Junctions Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. The Electrochemical Society, 2006 Published in: ECS Meeting Abstracts, MA2006-02 (2006) 20, Seite 1006-1006
Knezevic, Tihomir; Suligoj, Tomislav; Capan, Ivana; Nanver, Lis K. Low-Temperature Electrical Performance of PureB Photodiodes Revealing Al-Metallization-Related Degradation of Dark Currents Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2021 Published in: IEEE Transactions on Electron Devices, 68 (2021) 6, Seite 2810-2817
Shivakumar, D. Thammaiah; Knežević, Tihomir; Nanver, Lis K. Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Si Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2021 Published in: Journal of Materials Science: Materials in Electronics, 32 (2021) 6, Seite 7123-7135
Osrečki, Željko; Knežević, Tihomir; Nanver, Lis K.; Suligoj, Tomislav Indirect optical crosstalk reduction by highly-doped backside layer in single-photon avalanche diode arrays Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2018 Published in: Optical and Quantum Electronics, 50 (2018) 3
Liu, Xingyu; Nanver, Lis K.; Scholtes, Tom L. M. Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2017 Published in: Journal of Microelectromechanical Systems, 26 (2017) 6, Seite 1428-1434
Sammak, Amir; Aminian, Mahdi; Nanver, Lis K.; Charbon, Edoardo CMOS-Compatible PureGaB Ge-on-Si APD Pixel Arrays Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2016 Published in: IEEE Transactions on Electron Devices, 63 (2016) 1, Seite 92-99
Shi, Lei; Nihtianov, Stoyan; Nanver, Lis K.; Scholze, Frank Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2013 Published in: IEEE Sensors Journal, 13 (2013) 5, Seite 1699-1707
Sarubbi, Francesco; Scholtes, Tom L. M.; Nanver, Lis K. Chemical Vapor Deposition of α-Boron Layers on Silicon for Controlled Nanometer-Deep p + n Junction Formation Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2010 Published in: Journal of Electronic Materials, 39 (2010) 2, Seite 162-173
Sarubbi, Francesco; Nanver, Lis K.; Scholtes, Tom L. M. High Effective Gummel Number of CVD Boron Layers in Ultrashallow $\hbox{p}^{+}\hbox{n}$ Diode Configurations Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2010 Published in: IEEE Transactions on Electron Devices, 57 (2010) 6, Seite 1269-1278
Rinaldi, NiccolÒ; d'Alessandro, Vincenzo; Nanver, Lis K. Analysis of the Bipolar Current Mirror Including Electrothermal and Avalanche Effects Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electron Devices, 56 (2009) 6, Seite 1309-1321
Sarubbi, Francesco; Nanver, Lis K.; Scholtes, Tom L. CVD Delta-Doped Boron Surface Layers for Ultra-Shallow Junction Formation Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. The Electrochemical Society, 2006 Published in: ECS Meeting Abstracts, MA2006-02 (2006) 20, Seite 1000-1000
Qi, Lin; Mok, K. R. C.; Aminian, Mahdi; Charbon, Edoardo; Nanver, Lis K. UV-Sensitive Low Dark-Count PureB Single-Photon Avalanche Diode Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2014 Published in: IEEE Transactions on Electron Devices, 61 (2014) 11, Seite 3768-3774
Nanver, Lis K.; Hassan, Vinayak V.; Attariabad, Asma; Rosson, Nicholas; Arena, Chantal J. Broadband PureB Ge-on-Si Photodiodes Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2024 Published in: IEEE Electron Device Letters, 45 (2024) 6, Seite 1040-1043
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