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Heyman, Joseph S. [Editor] ; Electronics Reliability and Measurement Technology Workshop 1986 Hampton, Va

Electronics reliability and measurement technology : nondestructive evaluation

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Park Ridge, NJ: Noyes Data Corporation, 1988
McKerrow, Andrew J. [Other] ; Symposium Materials, Technology and Reliability for Advanced Interconnects and Low k Dielectrics 2003 San Francisco, Calif

Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 21 - 25, 2003, San Francisco, California, U.S.A. ; [Symposium E, held at the 2003 MRS spring meeting]

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Warrendale, Pa.: Materials Research Society, 2003

Published in: Materials Research Society: Materials Research Society symposium proceedings ; 76600
Gerling, Wolfgang H. [Editor] ; ESREF 3 1992 Schwäbisch Gmünd, Informationstechnische Gesellschaft, Gesellschaft Mikroelektronik, Informationstechnische Gesellschaft

Conference proceedings / ESREF 92

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Berlin; Offenbach: VDE-Verl., 1992
Dietrich, Manfred [Editor] ; Informationstechnische Gesellschaft, Informationstechnische Gesellschaft, Gesellschaft für Informatik, Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik, Fachtagung Zuverlässigkeit und Entwurf 2013 Dresden

Zuverlässigkeit und Entwurf : 7. ITG/GI/GMM-Fachtagung vom 24. bis 26. September 2013 in Dresden

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Berlin; Offenbach: VDE-Verl., 2013

Published in: Informationstechnische Gesellschaft: ITG-Fachbericht ; 244,buch
Jones, W. Kinzy [Editor]; Harsányi, Gábor [Other] ; NATO Division of Scientific Affairs, Advanced Research Workshop on Multichip Modules with Integrated Sensors 1995 Budapest, Advanced Research Workshop on Multichip Modules with Integrated Sensors 1995 Budapest

Multichip modules with integrated sensors : [proceedings of the NATO Advanced Research Workshop on Multichip Modules with Integrated Sensors, Budapest, Hungary, May 18 - 20, 1995]

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Dordrecht [u.a.]: Kluwer Acad. Publ., 1996

Published in: NATO: NATO ASI series / Partnership sub-series / 3 ; 16
International Integrated Reliability Workshop (1993 :Lake Tahoe, Calif.), IEEE Electron Devices Society, IEEE Reliability Society

1993 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 24-27, 1993

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[Piscataway, NJ]: [IEEE], 1993
Wafer Level Reliability Workshop (1992 :Tahoe, Lake, Calif. and Nev.), IEEE Electron Devices Society, IEEE Reliability Society

1992 International Wafer Level Reliability Workshop : final report : Stanford Sierra Lodge, Lake Tahoe, California, October 25-28, 1992

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[Piscataway, NJ]: [IEEE], 1992
Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society

2014 IEEE International Integrated Reliability Workshop final report (IIRW) : 12 - 16 Oct. 2014, Stanford Sierra Conference Center, South Lake Tahoe, California, USA

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Piscataway, NJ: IEEE, 2014
Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society

2013 IEEE International Integrated Reliability Workshop final report (IRW 2013) : 13 - 17 Oct. 2013, Stanford Sierra Conference Center, S. Lake Tahoe, California

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Piscataway, NJ: IEEE, 2013
Turner, Andrew A. [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

2012 IEEE International Integrated Reliability Workshop final report (IRW) : 14 - 18 Oct. 2012 ; Stanford Sierra Conference Center, S. Lake Tahoe, California

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Piscataway, NJ: IEEE, 2012
Geilenkeuser, Rolf [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

2011 IEEE International Integrated Reliability Workshop final report (IRW) : 16 - 20 Oct. 2011 ; Stanford Sierra Conference Center, S. Lake Tahoe, California ; 30th anniversary of IIRW

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Piscataway, NJ: IEEE, 2011
IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Integrated Reliability Workshop final report (IRW), 2010 : S. Lake Tahoe, California, USA, 17 - 21 Oct. 2010

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Piscataway, NJ: IEEE, 2010
Tao, Guoqiao [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Integrated Reliability Workshop final report, 2009 : IRW'09 ; 18 - 22 Oct. 2009 ; Stanford Sierra Conference Center, S. Lake Tahoe, California

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Piscataway, NJ: IEEE, 2009
Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society Taipei Chapter, IEEE Electron Devices Society

IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 : June 29, 2015 - July 2, 2015, Hsinchu, Taiwan

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Piscataway, NJ: IEEE, 2015
Institute of Electrical and Electronics Engineers, IEEE Reliability/CPMT/ED Singapore Chapter, IEEE Electron Devices Society

2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : June 30, 2014 - July 4, 2014, Marina Bay Sands, Singapore

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Piscataway, NJ: IEEE, 2014
Wang, Mingxiang [Other] ; Institute of Electrical and Electronics Engineers

2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 15 - 19 July 2013, Suzhou, China

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Piscataway, NJ: IEEE, 2013
Institute of Electrical and Electronics Engineers

19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 : 2 - 6 July 2012, Singapore

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Piscataway, NJ: IEEE, 2012
IEEE Reliability/CPMT/ED Singapore Chapter, IEEE Electron Devices Society

17th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 : 5 - 9 July 2010, Singapore

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Piscataway, NJ: IEEE, 2010
Lam, Tim Fai [Other] ; Institute of Electrical and Electronics Engineers

16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009 : IPFA 2009 ; 6 - 10 July 2009, Suzhou Industrial Park, Suzhou, China

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Piscataway, NJ: IEEE, 2009
International Reliability Physics Symposium (17th :1979 :San Francisco, Calif.), IEEE Electron Devices Society, IEEE Reliability Group

Reliability physics 1979 : 17th annual proceedings : San Francisco, California, April 24-26, 1979

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New York: IEEE Electron Devices Society, 2011 ; [S.l.]: HathiTrust Digital Library

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