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Liou, Juin J. [Author]

Advanced semiconductor device physics and modeling

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Boston [u.a.]: Artech House, 1994

Published in: The Artech House materials science library
Liou, Juin J. [Editor]; Iniewski, Krzysztof [Other]

Electrostatic discharge protection : advances and applications

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Boca Raton, FL; London; New York: CRC Press, Taylor & Francis Group, [2016]

Published in: Devices, circuits and systems
Gan, Zhenghao [Author]; Wong, Waisum [Author]; Liou, Juin J. [Author]

Semiconductor process reliability in practice

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New York [u.a.]: McGraw-Hill, 2013
Schwierz, Frank [Author]; Wong, Hei [Author]; Liou, Juin J. [Author]

Nanometer CMOS

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Singapore: Pan Stanford Publ., 2010
Liou, Juin J. [Organizer] ; ICEDA 2021 Online

2021 International Conference on Electron Devices and Applications (ICEDA 2021) : 14-16 August 2021, Nanjing, China

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... to E-book (freely accessible)

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[Bristol]: IOP Publishing, 08 November 2021

Published in: Journal of physics ; 2065
Wen, Xiaoqing [Organizer]; Liou, Juin J. [Organizer] ; International Conference on Circuits, Systems and Devices 4. 2020 Online

2020 The 4th International Conference on Circuits, Systems and Devices (ICCSD) 2020 : October 23-25, 2020, Nanjing, China

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[Bristol]: IOP Publishing, 13 January 2021

Published in: Journal of physics ; 1729
Liou, Juin J. [Author]; Ziegler, Martin [Author]; Schwierz, Frank [Author]

Gigahertz and terahertz transistors for 5G, 6G, and beyond mobile communication systems

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... to article via DOI (Volltext ; freely accessible)

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2024

Published in: Applied physics reviews ; 11(2024), 3, Artikel-ID 031318, Seite 031318-1-031318-37
Liou, Juin J. [Editor]; Liaw, Shien-Kuei [Editor]; Chung, Yung-Hui [Editor]

Nano Devices and Sensors

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... to E-book via De Gruyter

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Berlin ;Boston: De Gruyter, [2016]

Published in: De Gruyter eBook-Paket Technik, Informatik
Li, You; Liou, Juin J.

Evaluation of Transient Behavior of Polysilicon-Bound Diode for Fast ESD Applications

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Institute of Electrical and Electronics Engineers (IEEE), 2010

Published in: IEEE Transactions on Electron Devices, 57 (2010) 10, Seite 2736-2743
Li, You; Liou, Juin J.

Multiple-finger turn-on uniformity in silicon-controlled rectifiers

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Elsevier BV, 2010

Published in: Solid-State Electronics, 54 (2010) 12, Seite 1641-1643
Lou, Lifang; Liou, Juin J.

An Improved Compact Model of Silicon-Controlled Rectifier (SCR) for Electrostatic Discharge (ESD) Applications

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Institute of Electrical and Electronics Engineers (IEEE), 2008

Published in: IEEE Transactions on Electron Devices, 55 (2008) 12, Seite 3517-3524
Chen, Ji; Liou, Juin J.

Modeling of On-Chip Differential Inductors and Transformers/Baluns

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Institute of Electrical and Electronics Engineers (IEEE), 2007

Published in: IEEE Transactions on Electron Devices, 54 (2007) 2, Seite 369-371
Schwierz, Frank; Liou, Juin J.

RF transistors: Recent developments and roadmap toward terahertz applications

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Elsevier BV, 2007

Published in: Solid-State Electronics, 51 (2007) 8, Seite 1079-1091
Lou, Lifang; Liou, Juin J.

An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications

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Institute of Electrical and Electronics Engineers (IEEE), 2007

Published in: IEEE Electron Device Letters, 28 (2007) 12, Seite 1120-1122
Juin J. Liou; Frank Schwierz

Evolution and recent advances in RF/microwave transistors

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2004

Published in: Journal of Telecommunications and Information Technology (2004) 1
Yue, Yun; Liou, Juin J.

Effects of incomplete ionization of impurity dopants on the performance of bipolar junction transistors

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Elsevier BV, 1996

Published in: Solid-State Electronics, 39 (1996) 2, Seite 318-320
Liou, Juin J.; Chiang, Te-Kuang

A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs

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Institute of Electrical and Electronics Engineers (IEEE), 2018

Published in: IEEE Transactions on Electron Devices, 65 (2018) 10, Seite 4535-4541
Cui, Qiang; Zhang, Shuyun; Liou, Juin J.

Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology

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Elsevier BV, 2013

Published in: Microelectronics Reliability, 53 (2013) 7, Seite 952-955
Liou, Juin J.; Lai, Chao Sung

Editorial

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Elsevier BV, 2010

Published in: Microelectronics Reliability, 50 (2010) 5, Seite 583
Li, You; Liou, Juin J.; Vinson, Jim

Investigation of diode geometry and metal line pattern for robust ESD protection applications

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Elsevier BV, 2008

Published in: Microelectronics Reliability, 48 (2008) 10, Seite 1660-1663

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