Media type: Book Title: Lock-in thermography : basics and use for functional diagnostics of electronic components Contains: Literaturverz. S. [173] - 179 Contributor: Breitenstein, Otwin [Author]; Langenkamp, Martin [Author] imprint: Berlin; Heidelberg [u.a.]: Springer, 2003 Published in: Advanced microelectronics ; 10 Extent: VIII, 193 S.; Ill., graph. Darst Language: English ISBN: 3540434399 RVK notation: ZN 4032 : Nichtelektrische Prüfverfahren Keywords: Infrarotthermographie Infrarotthermographie Elektrisches Bauelement > Prüftechnik Origination: Footnote: Includes bibliographical references and index
Departmental Library DrePunct – open access area Shelf-mark: ZN 4032 B835 Item ID: 31662243 Status: Loanable